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. Author manuscript; available in PMC: 2020 Mar 1.
Published in final edited form as: IEEE Trans Microw Theory Tech. 2018 Dec 14;67(3):1184–1196. doi: 10.1109/TMTT.2018.2884405

Fig. 15.

Fig. 15.

Measured NIST standardized system phantom (a) cross-sections showing the different spheres of materials, (b) GRE image, and (c) flip angle (degree scale) and corresponding efficiency map (μT∕W).