Axial high resolution EPI of a subject with two chains of MR‐compatible EEG electrode assemblies applied on the same electrode positions as in clinical studies. On the right side of the head (electrode positions FP2, F8, T4, T6, O2), nonoptimized electrode assemblies (Ag/AgCl electrodes, carbon composition resistor) caused artifacts intruding into the cortex. Optimized electrode assemblies (Au electrodes, cermet film resistor) used on equivalent positions on the left side of the head did not compromise the cortical signal. Both electrode assemblies contained identical copper leads, heatshrink resistor insulation, and 0.1 ml of Dracard electrode gel.