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. 2019 Nov 9;20(22):5609. doi: 10.3390/ijms20225609

Table 2.

Graphene oxide (GO)/support material characterization techniques (gas separation applications) a.

Characterization Approach Measurements References Major Findings
SEM (FE-SEM) Size and distribution of the GO flakes [2,3,4,5,41] GO particle size of 0.1–20 µm
TEM Thinness and curliness of the GO nanosheets [2,5,41] Effectiveness of the method of exfoliation
AFM Surface morphology and depth profile of the GO membrane [2,3,4,5,34,41] Thickness of a single GO layer of 0.7–0.9 nm
XPS Surface chemical composition [3,4,5] Density of different bonds, e.g., C = C (28.04%), C–C (13.79%), C = O (27.11%), C–O (14.62%), O–C = O (12.52%)
XRD Amount of GO content and curvature in the polymeric support for GO membranes [4,5,41] GO has a peak 2θ at 11.1°
FTIR Analysis of the functional groups [4,5,41] Functional groups in the form of stretching vibrations of different bonds, e.g., O–H (3400 cm−1), C = O (1720 cm−1), C = C skeletal (1620 cm−1), C–O carboxyl (1390 cm−1), C–O epoxy (1195 cm−1), and C–O alkoxy (1035 cm−1)
Raman spectroscopy Structural integrity of the GO membrane [3,4,5,41] GO powder: G band at 1585 cm−1 and D band at 1338 cm−1
WCA Wettability of the GO membrane [5] GO membrane WCA of 46.7 ± 1.1°
DLS Particle size distribution [34] Particle size distribution of the GO membrane, e.g., 10 µm (30%), 20 µm (40%)
TGA Weight percentage of GO or a GO–polymer composite with variation in temperature [41] Weight percentage of GO or a GO–polymer composite at different temperatures

a SEM, scanning electron microscopy; FE-SEM, field emission scanning electron microscopy; TEM, transmission electron microscopy; AFM, atomic force microscopy; XPS, X-ray photoelectron spectroscopy; XRD, X-ray diffraction; FTIR, Fourier-transform infrared spectroscopy; WCA, water contact angle; DLS, dynamic light scattering; TGA, thermogravimetric analysis.