COTS	Commercial-off-the-shelf
CubeSats	Cube satellites
LEO	Low earth orbit
TC	Thermal cycling
BAT	Battery
EXT	External
PCB	Printed circuit board
MB	Motherboard
FPGAs	Field-programmable gate arrays
GEO	Geostationary orbit
ICs	Integrated circuits
EM	Electromigration
TDDB	Time-dependent dielectric breakdown
SM	Stress migration
MTTF	Mean time to failure
RAMP	Reliability-aware microprocessor
NBTI	Negative bias temperature instability
SOFR	Sum-of-failure-rates
DPM	Dynamic power management
DVS	Dynamic voltage scaling
DTM	Dynamic thermal management
ECUs	Electronic control units
DVFS	Dynamic voltage and frequency scaling
EDF	Earliest-deadline-first
PWL	Piece-wise linear
WF	Worst-fit