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. 2019 Dec 5;10:5565. doi: 10.1038/s41467-019-13537-z

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© The Author(s) 2019

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — Measured conductance of bare silver atomic-scale junctions and Ag/vanadocene molecular junctions. a Schematic representation of spin-filtering by interfering current pathways in a Ag/vanadocene single-molecule junction. b Schematics of the break-junction setup. c Characterization of bare silver atomic junctions. Left panel: examples for conductance versus inter-electrode displacement traces recorded at a bias voltage of 100 mV, with traces shifted in the displacement axis for clarity; Middle panel: conductance histogram constructed from 5,000 conductance traces; Right panel: conductance–displacement density plot based on the same conductance traces. d Similar characterization for Ag/vanadocene molecular junctions, with histograms based on the same number of traces. Zero displacement is determined for each conductance trace by the first displacement point with a conductance value below 4 $G_{0}^{s}$ . Information on the measurement circuit can be found in Supplementary Note 1.