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. 2019 Nov 25;116(50):24949–24955. doi: 10.1073/pnas.1909660116

Fig. 3.

Fig. 3.

Enhancement of the crystal nucleation frequency J0 near the spinodal temperature of LLT, TSD. (AC) Images show crystals observed with polarizing microscopy in TPP samples, which were first quenched to (A) Ta=220 K, (B) 217 K, and (C) 150 K and annealed there for 5 min, then heated to Tx=235 K with a rate of 100 K/min and annealed for 20 min. We stress that the crystallization always takes place at Tx=235 K. (Scale bar: A, 20 μm; also applies to B and C.) (D) The crystal nucleation rate J0 at Tx=235 K (circles) and 240 K (squares) as a function of Ta for a sample with S fluctuations, which is annealed at Ta for 5 min. The J0 for the ordinary crystallization protocol is also shown by green triangles, together with the CNT prediction (green solid curve) (SI Appendix, section 3 and Fig. S3). This J0 without S fluctuations obeys the CNT prediction, as expected. The vertical black dashed line indicates the location of TSD. For both Txs, J0 for crystallization of a sample with S fluctuations increases very steeply when TaTSD. The filled red circle corresponds to J0 for a sample directly quenched to 235 K from melt; that is, it corresponds to J0 in absence of S fluctuations at Tx=235 K. The horizontal red dashed line is the value of J0 expected in the absence of LLT. For Ta225 K, the number of crystal nuclei becomes very small, leading to a larger statistical error. The data are the crystal nucleation rate averaged over 10 times. The error bars are shown in the plot only when they exceed the size of the symbols (SI Appendix, section 2) (E) The difference δΔGc between ΔGc at 235 K and that at Ta as a function of ϵ=(TaTSD)/TSD. The solid curve is a fit by G0+G1ϵν with ν=0.56 (see text).