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. 2019 Nov 27;12(23):3926. doi: 10.3390/ma12233926

Figure 3.

Figure 3

Scheme of the specimen preparation for scanning electron microscope (SEM) evaluation: (a) Cracked specimen with marked Surface 1 and 2; (b) cut fragment of the specimen to be analyzed with SEM with marked Surface 1, Cross-section 1, and Cross-section 2.