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. 2019 Dec 23;9:19639. doi: 10.1038/s41598-019-55898-x

Figure 4.

Figure 4

(a) Overall view of the diode IV measurement cell and magnified view of the diode portion; nine diodes with a contact area of 900 μm2 were fabricated on a silica substrate, and (b) Cross sectional view of the diode part, obtained by TEM.