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. 2019 Nov 28;20(23):5991. doi: 10.3390/ijms20235991

Figure 1.

Figure 1

Surface analysis; (a) Scanning electron microscopy (SEM), (b) scanning probe microscopy (SPM), (c) X-ray photoelectron spectroscopy (XPS), (d) thin-film X-ray powder diffractometry (TF-XRD), (e) contact-angle.