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. 2019 Dec 20;14:10009–10021. doi: 10.2147/IJN.S221496

Figure 1.

Figure 1

Characterization of UCNPs and UCNPs@mSiO2. (A) Schematic drawing showing the fabrication process of UCNPs@mSiO2-Ce6-GPC3. (B) XRD patterns of UCNPs, UCNPs@mSiO2 and the standard XRD pattern of NaGdF4 (JCPDS No.27–0699). Representative transmission electron microscope images of (C, a) NaGdF4:Yb, Er, (C, b) NaGdF4:Yb, Er@NaGdF4:Yb, (C, c) NaGdF4:Yb, Er@NaGdF4:Yb@NaNdF4:Yb (UCNPs) and (C, d) NaGdF4:Yb, Er@NaGdF4:Yb@NaNdF4:Yb @mSiO2(UCNPs@mSiO2).