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. 2019 Dec 27;9:19846. doi: 10.1038/s41598-019-56338-6

Figure 9.

Figure 9

Effective capacitance Ceff versus open-circuit voltage Voc. Contrary to the effective capacitances of the first (fast-process) CPE, those of the second (slow-process) CPE shows appreciable increase with respect to open-circuit voltages. Slopes in a semi-log plot of Ceff versus Voc correspond to tailing parameters Et that characterize tail-like exponential distribution of defects.