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. 2019 Dec 10;64(1):38–54. doi: 10.1093/annweh/wxz088

Figure 7.

Figure 7.

Sonication of substrates with Si nanowires in the post-production laboratory measured during Study 2. Total particle number concentration measured in the emission zone, EZ (with APS, 0.5–20 µm, and CPC, >0.007 µm) and the background zone, BG (with APS and CPC). The numbers indicate when the 14 different substrates were handled during the work task.