Table II.

Analysis and Resolvability of Simulated Data

τ2/τ1	Δλ	F	θD	% noise	λ	SD/τi	SD/f2(λ)	Resa
2.0b	20	7	12	2	13	0.015	0.099	+
1.8c						0.016	0.13	M
1.7						0.018	0.17	−
2.0d	10					0.021	0.12	M
	5					0.031	0.18	−
2.0e	20	5				0.016	0.10	M
		4				0.016	0.16	−
2.0f	20	7	8			0.018	0.13	M
			6			0.021	0.13	−
2.0	20	7	12	3		0.022	0.14	M
				4		0.030	0.21	−
2.0g	20	7	12	2	11	0.018	0.12	M/−
					9	0.026	0.18	−

^aIf Res is +, M, or −, the data are resolvable, marginally resolvable, or not resolvable

^bFor all simulated data, τ₁ = 5.0 and τ₂ = 10 ns and λ₁ = 470 and λ₂ = 490 nm. Data for seven F between 3.0 and 93.0 MHz, 12 θ_D total (six θ_D between 0 and 100° for I_p data), and 13 wavelengths between 450 and 510 nm, were fit except as indicated. See text for further details.

^cData as in footnote b but τ₂ = 9.0 (τ₂/τ₁ = 1.8) or 8.5 (τ₂/τ₁ = 1.7) ns.

^dAs in footnote b but λ₂ = 480 (Δλ = 10) or 475 (Δλ = 5) nm.

^eData fit as in footnote b but using five (3, 18, 33, 63, 93 MHz) or four (3, 33, 63, 93 MHz) frequencies (F).

^fData fit using eight (for L at 0, 20, 60, 100°) or six (for I_p at 20, 60, 100°) detector phase angles (θ_D).

^gThe number of wavelengths were 11 (from 455 to 505 nm) or 9 (from 460 to 500 nm).