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. 2019 Dec 7;12(24):4095. doi: 10.3390/ma12244095

Figure 2.

Figure 2

Sequence of SEM images showing atom probe specimen preparation from TiCx particles. (a) pick-up of one particle using the manipulator, (b) particle transfer from the manipulator to a steel tip, and (c) and (d) annular milling for the final tip.