Skip to main content
. 2020 Jan 1;7(Pt 1):30–41. doi: 10.1107/S2052252519014003

Figure 3.

Figure 3

Areas of chips measured for REP24 at (a) in-vacuum at CXI and (b) in humidified He at MFX, represented by the median-intensity heat maps below. Heat maps of median scattered intensity overlaid with contour plots of hit rate averaged spatially over a 250 µm radius for (c) the enclosed REP24 sample at CXI, (d) the REP24 sample at MFX and (e) the thin-film/PMMA-FLG sample at CXI.