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. 2020 Jan 10;11:211. doi: 10.1038/s41467-019-14047-8

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a Sketch of the thin film thickness measurement by the environmental nanoindentation method. d_film (d_ITO) denotes the travel displacement of the tip when the contact between the tip and the film (ITO) is detected. b Thickness of PProDOT in the pristine and oxidized states. The upper panel shows tip displacement measured by targeted indentation. The lower panel shows the tip displacement in the x-direction measured by the scratch test. For both methods, the step height denotes the thickness of the film. c A volumetric strain ε_V in the range of 20–30% is determined for PProDOT upon oxidation using the scratch and targeted indentation methods.