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. 2019 Dec 12;9(12):1769. doi: 10.3390/nano9121769

Figure 2.

Figure 2

Atomic force microscopy (AFM) images of PCL-ref (A), PCL–TiCaPCON (B), PCL–COOH (C), PCL-ref-SBF-72h (D), PCL–COOH-SBF-72h (E), and PCL–TiCaPCON-SBF-72h (F,G) samples.