Fig. 20.

Relative expected yield variation of a $Z\to \ell \ell$ and b VBF $H\to \mathit{\tau }\mathit{\tau }$ events and c signal purity as a function of the number interactions per bunch crossing ($⟨\mathit{\mu }⟩$), with different levels of pile-up rejection using ${\mathrm{fJVT}}_{\mathit{\gamma }}$. The expected signal and background yields at $⟨\mathit{\mu }⟩=10$ are used as reference. Parameterized hard-scatter efficiency and pile-up efficiency are used. The lower panels display the ratio to the reference without pile-up rejection