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. 2020 Jan 17;11:357. doi: 10.1038/s41467-019-14199-7

Fig. 3. Structure characterizations.

Fig. 3

a Photograph of MC, MCC, MC-r, and OxgeMCC-r SAE. b Powder XRD of corresponding materials. c Enlarged powder XRD (2θ from 16 to 18 degree) of b. d HAADF-STEM image and corresponding EDS elemental mapping (Mn, Co, Ru, N, O, and C elements) of OxgeMCC-r SAEs. Scale bar is 100 nm. e C 1s XPS spectrum magnified from Supplementary Figs. 1 and 3. Inset is the enlarged Ru 3d spectrum of MC-r. f C K-edge NEXAFS spectra of MC and MC-r. g N K-edge NEXAFS spectra of MC and MC-r.