Figure 1.

Graphical representation of the used two-beam direct laser interference patterning (DLIP) process, showing the most relevant parameters describing both the pattern and the process: $\omega$—beam radius; $\mathsf{\theta }$—beams intersection angle; $\Lambda$—laser intensity profile/ ablated structure period; d—distance between the laser spots; $OVP$—spot overlap; $v$—samples’ translation speed; rth—radius of ablated area; h—ablated structure depth.