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. 2020 Jan 15;26(1-2):15–27. doi: 10.1089/ten.tea.2019.0051

Table 1.

Energy-Dispersive X-ray Spectroscopy Analysis of Atomic Surface Composition of SiON, SiONP1, and SiONP2 Coating

Sample Si (at %) O (at %) N (at %) P (at %) P/N
SiON 52.5 35.1 12.3 0 0
SiONP1 61.8 7.3 30.5 0.28 0.9
SiONP2 58.7 14.2 26.8 0.27 1.0

SiONP, silicon oxynitrophosphide.