Figure 3.

Nanowire. (a,b) DP and HRTEM images of corresponding nanowires at the [010] and [100] zone axes, respectively. The d spacings measured correspond to the (100) and (010) of the orthopyroxene phase, and the HRTEM simulations inserted are calculated from the orthopyroxene structure with a multislice approach. The defocus value and sample thickness are 77 and 50.58 nm in panel (a) and 107 and 31.08 nm in panel (b). The scale bar in TEM micrographs is 20 nm. (c) The [010] projections of the three polymorphs of MgSiO₃ generated by Vesta²⁸ including ICSD 9328, ICSD 30808, and ICSD 30893.