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. 2019 Jun 17;91(14):8994–9000. doi: 10.1021/acs.analchem.9b01222

Figure 2.

Figure 2

Raman spectra of a homogeneous phantom with no inclusions (thickness t = 15 mm) of PTFE (a), PS (b), and PE (c) measured at different spatial offsets (SO: 0 to 10 mm) and in transmission (TRS) geometry. The Raman spectra are normalized to the maximum peak intensity (height) of the most intense band in the spectrum. The black dotted line shows the Kubelka–Munch (k/s) parameter (absorption) calculated from the measurement of diffuse reflectance. (d, e) Differential Raman spectra for the TRS and 0 mm offset measurements (i.e., ΔRaman(0 mm – TRS), blue line) and 10 and 0 mm offset (i.e., ΔRaman(0 mm – 10 mm), black line). Black-filled circles (●) indicate the position of the Raman peak used to reconstruct the attenuation profile (k/s) from differential Raman spectra (red dotted line). The black dotted line shows the absorbance (k/s) measured with the spectrophotometer.