Table 2. Diffraction data-collection parameters.
| Diffraction source | Beamline I03, DLS |
| Wavelength (Å) | 0.976 |
| Temperature (K) | 100 |
| Detector | EIGER2 XE 16M |
| Crystal-to-detector distance (mm) | 288.18 |
| Rotation range per image (°) | 0.1 |
| Total rotation range (°) | 180 |