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. 2020 Feb 3;76(Pt 2):74–80. doi: 10.1107/S2053230X20001168

Table 2. Diffraction data-collection parameters.

Diffraction source Beamline I03, DLS
Wavelength (Å) 0.976
Temperature (K) 100
Detector EIGER2 XE 16M
Crystal-to-detector distance (mm) 288.18
Rotation range per image (°) 0.1
Total rotation range (°) 180