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. 2020 Feb 10;11:823. doi: 10.1038/s41467-020-14481-z

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a Schematic of the LPE synthesis of monolayer PbI₂ flakes and deposition on to suspended graphene. b, c ADF-STEM image of monolayer PbI₂ flakes at different magnifications. d Atomic resolution ADF-STEM image of a monolayer PbI₂ flake. The inset in the figure shows an atomic resolution image of the structure. The scale bar is 0.5 nm. e Typical method for measuring the length(l) and width(w) of the monolayer flake. f Histogram showing the thickness distribution of PbI₂ flakes. g Plot of the size distribution for >300 monolayer flakes. Overlapping sizes of different flakes show darker color for their marker dots. The oval represents the highest congregation of flake sizes in the overall sample distribution.