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. 2020 Jan 15;21(2):550. doi: 10.3390/ijms21020550

Figure 1.

Figure 1

SEM micrographs showing the surface of (A) F-Alg/Chito and (B) F-Alg/Chito/BBS. The inset in section B reports the aspect of the surface after brief (few seconds) and prolonged (ca. 1 min) exposure to the electron beam (the arrows evidence the defects formed during the exposure).