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. 2020 Jan 14;10(1):147. doi: 10.3390/nano10010147

Figure 2.

Figure 2

(A) Setup of the Ti:Sa laser system (BAM). The beam is directed using several mirrors (M), the polarization is defined by a half-wave plate (λ/2) and is finally focused in a static position on the sample by a spherical dielectric mirror (SM) of 500 mm focal length. The sample is positioned and translated by a motorized X-Y-Z translation stage. (B) Setup of the Yb-doped fiber laser (CSIC). The beam power is controlled by a combination of a half-wave plate (λ/2) and a thin film polarizer (P). The beam scans the sample by a galvanometric mirror-based scanning head, and it is focused by a 100 mm F-theta lens. The sample is mounted in a Z-axis translation stage to control the focusing of the beam. (C) Plot that displays the obtained type of surface structures on CrN for a combination of number of effective pulses (Neff_1D) and peak fluences used for the formation of (■) roughness, () indicates the presence of LSFL, () indicates the presence of LSFL and (×) marks the conditions where the CrN layer has been destroyed.