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. 2020 Feb 21;11:996. doi: 10.1038/s41467-020-14793-0

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — Red and blue lines correspond to on-axis and one exemplary off-axis positions of the beam. Dotted lines correspond to a Bragg reflection. Optical planes and electron-optical elements are shown in black and gray, respectively. a In the mapping configuration, the beam is collimated by the lower condenser lens (CL 2) and focused on the sample using the objective lens pre-field (OL pre). Scattered beams from the illuminated sample position are imaged on the high-angle annular dark field (HAADF) detector using the objective lens post-field (OL post) and the intermediate and projection lenses (IL/PL). b In the diffraction configuration, on the other hand, the condenser focuses the beam on the front-focal plane (FFP) of the objective. Diffraction orders now appear as discrete spots on the diffraction detector (CAM). Note that switching between these configurations involves changing of the CL 2 excitation only, as the detectors always remain in a plane conjugate with the back and front-focal planes of the objective lens (diffraction mode). SPOT—first condenser lens (spot) crossover; DEF1/2—upper and lower beam deflector pair; IMG—intermediate image plane.