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. 2020 Feb 2;21(3):984. doi: 10.3390/ijms21030984
BOE   Buffered Oxide Etch
CPD   Critical Point Drying
EBL   Electron Beam Lithography
HF   Hydrofluoric Acid
HSQ   Hydrogen Silsesquioxane
ICPRIE   Inductively Coupled Plasma Reactive Ion Etching
NMP   N-Methyl-2-Pyrrolidone
PMMA   Poly Methyl Methacrylate
SOI   Silicon-on-Insulator
ZEP   αMethylstyrene