Table V:

Contributions to type B uncertainty

correction	magnitude $(\frac{\mathbf{\Delta }\mathit{E}}{\mathit{E}}/{\mathbf{10}}^{-\mathbf{6}})$	uncertainty $(\frac{\mathbf{\Delta }\mathit{E}}{\mathit{E}}/{\mathbf{10}}^{-\mathbf{6}})$	explanation
axial divergence	≈ −5	0.25	axial fit statistics compared to pooled data statistics (actual value depends on which crystal setup)
slit height	−0.002	0.00	Δθ = a2 tan θ / (24L2)
temperature	−6.63	0.05	(t = tlab) – (t = 22.5) lattice parameter shift from crystal lattice reference temperature, limited by 0.02C temp uncertainty
index of refraction	−2.6	0.005	δ / sin2 θ, limited by form factor uncertainty estimated at 0.2 %
dynamical asymmetry	0.015 (1+1), 0.055 (3+3)	0.01	previous Monte-Carlo models with copper agree with measured non-dispersive curve. With Mo, non-dispersive curve is too narrow to resolve directly.
efficiency slope T(E)	0.03	0.05	from atmospheric pressure 10 % bounds
angle errors	0.00	0.09	assuming 0.05″ k=1 uncertainty [15]
Si d-spacing	0.00	0.03	in vacuo uncertainty
Si atmospheric compression	0.35	0.015	95 kPa to 105 kPa atmospheric pressure range (extreme limits)