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. Author manuscript; available in PMC: 2020 Feb 28.
Published in final edited form as: ACM Transact Des Autom Electron Syst. 2019;24(3):10.1145/3315571. doi: 10.1145/3315571

Table 1:

Threat coverage of existing mitigation techniques [14] and proposed framework.

Mitigation techniques Overproduction Recycling Remarking Cloning Out-of-spec/Defective
Physical inspection [2] NA Low Low NA NA
Electrical measurement [5] NA Medium Medium NA Low
Recycling detection sensor [52] NA High High NA NA
Secure split test [8] High NA Low Medium High
Hardware metering [28] Low NA Low Low NA
Split manufacturing [40] High NA NA Low NA
IC camouflaging [39] NA NA NA Medium NA
Hardware watermarking [6] NA NA NA Medium NA
PUF [46, 17] Low Low NA Medium NA
Package ID-based technique [21] NA Medium Medium NA NA
Proposed framework High High High High High