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. 2020 Mar 2;76(Pt 3):103–108. doi: 10.1107/S2053230X2000031X

Table 2. Data-collection and processing statistics for the TTBK2–compound 1 complex.

Values in parentheses are for the outer shell.

Diffraction source X06SA (PXI) beamline, SLS
Wavelength (Å) 0.98
Temperature (K) 100
Detector EIGER 16M
Crystal-to-detector distance (mm) 206.15
Rotation range per image (°) 0.25
Total rotation range (°) 180
Exposure time per image (s) 1
Space group P212121
a, b, c (Å) 56.23, 114.68, 118.70
α, β, γ (°) 90, 90, 90
Total No. of reflections 514475
No. of unique reflections 147854
Mosaicity (°) 0.06
Resolution range (Å) 50–1.74
Total No. of reflections 514475
No. of unique reflections 147854
Completeness (%) 97.9 (95.4)
Multiplicity 6.6
R work/R free (%) 19.4/23.4
I/σ(I)〉 16.75/0.95
CC1/2 0.99 (0.52)
Overall B factor from Wilson plot (Å2) 40.42
R.s.m.d., bond distances (Å) 0.016
R.s.m.d., bond angles (°) 1.47
Ramachandran plot
 Preferred (%) 97.22
 Allowed (%) 2.78
 Disallowed (%) 0.4

The resolution at which 〈I/σ(I)〉 falls below 2.0 is 1.9 Å. The cutoff value for 〈I/σ(I)〉 was based on a half-data-set correlation coefficient (CC1/2) cutoff value of 0.5.