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. 2020 Mar 6;6(10):eaay2324. doi: 10.1126/sciadv.aay2324

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Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 1 — (A) X-ray diffraction (XRD) spectra of 0.5 Ta/[0.35 Bi|0.35 Sb]_N/0.3 Bi/2 CoFeB/2 MgO/1 Ta with N = 8 (blue line) and N = 16 (red line). a.u., arbitrary units. (B) AFM image of the N = 8 film. A line profile along the blue solid line drawn in the bottom image is shown at the top. (C) Cross-sectional HAADF-STEM images of the N = 16 structure. Selected nanobeam diffraction pattern of the Bi|Sb multilayer is shown in the inset.