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. 2020 Mar 9;10:4387. doi: 10.1038/s41598-020-61111-1

Figure 4.

Figure 4

(A,B) TEM photomicrograph of a single ultrathin section along with the corresponding electron diffraction pattern (SAED) at each spot ‘I’ to ‘IV’ in (A) and ‘I’ to ‘lll’ in (B).