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. 2020 Mar 13;11:1391. doi: 10.1038/s41467-020-15159-2

Table 1.

Comparison of the various reported Fe-diode devices.

Structure Substrate Preparation method Thickness of Fe material Current density Nonlinearity On/off ratio
Au/PbTiO3/LSC16 LaA1O3 Epitaxial deposition 200 nm 0.1 A/cm2 2 2
PZT/(LSMO)38 SrTiO3 PLD 30 nm 0.1 A/cm2 2 300
Ag/BFO/Ag17 / / 90 um 20 mA/cm2 5 20
Ta/PZT/SRO39 SrTiO3 PLD 100 nm 2 A/cm2 2 1.5
SRO/PZT/SRO40 SrTiO3 PLD 150 nm 10 mA/cm2 2 4
SRO/BFO/Pt18 SrTiO3 PLD 120 nm 5.4 A/cm2 5 4
SRO/BFO/Pt41 SrTiO3 PLD 40 nm 2 753
This work SiO2 ALD 10 nm 200 A/cm2 100 10,000