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. 2020 Jan 24;10(2):201. doi: 10.3390/nano10020201

Figure 9.

Figure 9

SEM images (two magnifications) of MoSx~3+δ films obtained on (a) Si/SiO2 and (b) glassy carbon substrates by off-axis PLD in Ar at a pressure of 8 Pa for 20 min. The top inset in (a) shows a cross-sectional image of the film.