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. 2020 Mar 16;10:4828. doi: 10.1038/s41598-020-61602-1

Table 4.

Overall comparison of the parameters extracted from different methods.

Characterization Method Device (n) Rs (kΩ) ΦB (eV)
Conventional I–V Ag/F8/P3HT/ITO 4.03 269 1.03
Ag/F8-CdSe/P3HT/ITO 2.38 78.2 1.17
Cheung Function Ag/F8/P3HT/ITO 4.26 310 1.11
Ag/F8-CdSe/P3HT/ITO 2.42 89 1.20
Norde’s Function Ag/F8/P3HT/ITO 301 1.10
Ag/F8-CdSe/P3HT/ITO 90 1.22