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. 2020 Feb 20;13(4):956. doi: 10.3390/ma13040956

Figure 1.

Figure 1

Particle being prepared for EDS and EBSD analyses. (a) Ion milling and polishing, (b) FIB image during milling, (c) a sample in a position for EDS analysis, (d) a sample in a position for EBSD analysis.