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. 2020 Mar 18;10:4938. doi: 10.1038/s41598-020-61675-y

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Schematic illustration of the dielectric screening of Coulomb interaction. Due to the ultrathin body of 2D materials, the Coulomb interaction between charged particles inside the system is sensitive to the environment as represented by the relative distances between charged particles and different ranges of electric field lines in the (a) multilayer MoS₂, (b) monolayer MoS₂ on a dielectric substrate, and (c) free-standing monolayer MoS₂²³. As illustrated, the Coulomb interaction within 2D materials can be modified through environmental dielectric screening.