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. 2020 Mar 19;10:5054. doi: 10.1038/s41598-020-61926-y

Figure 2.

Figure 2

(a) Rocking curves of the Si(422) split-and-delay optics measured at an X-ray energy of E0 = 7.9 keV. (b) (Upper row) Histograms of the successive intensities and corresponding fits to Gamma distribution. (Lower row) Simulation results of the corresponding histograms.