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. 2020 Mar 20;11:1493. doi: 10.1038/s41467-020-15293-x

Fig. 3. Classification accuracy of simulated data.

Fig. 3

Data were assessed with a model 07VEJJ, or b Getis & Franklin’s Local Point Pattern Analysis, or c Bayesian Cluster Analysis on 3 × 3 μm centered regions extracted from the data sets analyzed by a and b. Model 07VEJJ shows comparable performance at very high point densities (d), when the number of points per cluster matches the limit of the models near-neighbor distances ‘reach’ (e) (n.d. = not determined), and very low point densities (f). g Classification accuracy for completely spatially random data at different point densities analyzed by Model 07VEJJ or the Bayesian method; d.n.f. = did not finish. Data are mean values from ten replicates.