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. 2020 Feb 28;13(5):1081. doi: 10.3390/ma13051081

Figure 6.

Figure 6

Atomic force microscopy (AFM) height images (left) and cross-sectional profiles (right) of (a) GO30L-1000, (b) GO30L-2000, (c) GO30L-4000, and (d) GO30S-4000 GO fractions.