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. Author manuscript; available in PMC: 2020 Apr 1.
Published in final edited form as: Small. 2019 Mar 5;15(14):e1805526. doi: 10.1002/smll.201805526

Figure 4. Electrical characterization of the device.

Figure 4

A. Resistance before and after release from the silicon wafer. B. Resistance measured as a function of tensile strain. C. Resistance measured over 1000 cycles of tensile extension between 5% and 20%. D. Cyclic voltammogram of the device before and after fibronectin coating. E. Impedance characterization of electrodes evaluated in cell culture medium.