Figure 4. Electrical characterization of the device.
A. Resistance before and after release from the silicon wafer. B. Resistance measured as a function of tensile strain. C. Resistance measured over 1000 cycles of tensile extension between 5% and 20%. D. Cyclic voltammogram of the device before and after fibronectin coating. E. Impedance characterization of electrodes evaluated in cell culture medium.