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. 2019 Oct 16;692:137637. doi: 10.1016/j.tsf.2019.137637

Table 3.

The characteristic temperature (T0), activation energy (Ea) and temperature coefficient of resistance (TCR) of [(NixMn1-x)0.84Cu0.16]3O4 thin films.

x (mol) T0 (K) Ea (eV) TCR (%/K)
0.20 2876 0.2479 −3.196
0.25 2794 0.2408 −3.104
0.30 2655 0.2289 −2.950
0.35 2398 0.2067 −2.664
0.40 2314 0.1995 −2.571