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. 2020 Apr 2;11:1634. doi: 10.1038/s41467-020-15478-4

Fig. 1. Schematic illustration of eutectic strategy for dendrite and crack suppression.

Fig. 1

a Monometallic Zn electrodes with abundant cracks or defects that are produced by uncontrollable volume change in the Zn stripping/plating processes. b Growth of Zn dendrites triggered by uncontrollable volume change and tip effect. c Eutectic Zn/Al alloys with a lamellar structure composed of alternative Zn and Al nanolamellas in-situ produce core/shell interlayer patterns during the Zn stripping to guide the subsequent Zn plating. d The Al/Al2O3 interlayer patterns associated with insulative Al2O3 shield facilitate the uniform deposition of Zn.