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. 2017 Sep 18;100:312–325. doi: 10.1016/j.bios.2017.09.024

Fig. 5.

Fig. 5

(a) Schematic and (b-e) SEM images of the Au NPs embedded SiNW device. (b) The cracked Au film due to incomplete agglomeration at 400 °C and (c) Au NPs after complete agglomeration at 500 °C. The SEM high resolution view at the top (d) and the side (e) of the SiNW. Images reprinted from (Ryu et al., 2010).