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. 2020 Apr 7;11:1728. doi: 10.1038/s41467-020-15519-y

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© The Author(s) 2020

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — a Reflectivity plot for an LTON film exposed to electrolyte and light intensity, yet no external bias was applied to the sample and showed no photoelectrochemical performance. b Reflectivity curve for LTON thin film comparing before and after PEC measurements with applied bias. c Experimental and corresponding model fit for data shown in (b), shown by the solid and dashed lines respectively. d The inferred scattering length density profile as a function of depth from the corresponding fit. The inset shows the magnified region at and near to the surface of LTON. e Depth profile of the samples before and after PEC, where the largest change in the SLD corresponds to a more oxidised surface layer of 3 nm.