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. 2020 Mar 10;11(3):290. doi: 10.3390/mi11030290

Figure 11.

Figure 11

(a) Atomic Force Microscope (AFM) image showing large ordered regular arrays, with typical dimension of 50 µm × 50 µm, with a periodic pitch of about 1µm and amplitude of the wrinkle of ~ 200 nm. (b) Intensity of the transmittance diffraction at different applied strain levels.