Figure 4.

Experimental characterization of 36-duplex nanotubes with various pleat angles. (A) Design schematics and representative TEM micrographs of 36-duplex nanotubes with pleat angles of 51°, 69°, 120° and 171° from left to right respectively (scale bars 100 nm). Inset: 2D class averages (scale bars 50 nm) (B) Histograms of width measurements from TEM micrographs of all four designs overlaid with Gaussian fits. (C) Representative single particles from cryo-EM micrographs captured end-on showing the different pleated structures of each design (scale bars 50 nm). (D) SAXS data and analytical fits for three of the nanotube designs. Inset: Model fit parameters, where ‘D’ and ‘Th’ are the diameter and wall thickness respectively of the model cylinder and ‘CV’ is the coefficient of variation of D.