Table 3.
Summary of uncertainties
Source of uncertainty | 1Sd→2Pc− Doubly spin-polarized (MHz) | 1Sd→2Pf− Doubly spin-polarized (MHz) | 1Scd→2Pc± Singly spin-polarized (MHz) | 1Scd→2Pf± Singly spin-polarized (MHz) |
---|---|---|---|---|
Lineshape fit statistics | 55 | 54 | 45 | 47 |
Fitting-model dependence | 24 | 42 | 17 | 62 |
Wavemeter drift | 30 | 30 | 30 | 30 |
Wavemeter offset | 18 | 18 | 18 | 18 |
730-nm cavity frequency correction | 18 | 18 | 18 | 18 |
Residual 1Sc state atoms in doubly spin-polarized sample | 23 | 16 | 0 | 0 |
Magnetic field | 5 | 8 | 5 | 8 |
Total | 76 | 81 | 62 | 88 |
Estimated uncertainties (1σ) at 121.6 nm for each transition (Methods).